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WLAN Test Set MT8860C
WLAN Test Set MT8860C

WLAN Test Set MT8860C

Anritsu

Manufacturers

Anritsu

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Model

MT8860C

Parameters

The MT8860C is an integrated one-box test set dedicated to testing 802.11 WLAN devices

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The MT8860C is an integrated one-box test set dedicated to testing 802.11 WLAN devices. It provides a high-speed measurement solution that is suitable for both production testing and design proving.

The MT8860C has two modes of operation: Network and Direct. The "Network" mode uses standard WLAN signaling and can be used for testing both the transmitter and receiver of DUTs. In "Direct" mode, the MT8860C tests DUT receivers by generating and transmitting WLAN packets, and tests DUT transmitters with its built-in transmitter analyzer. In Direct mode, the DUT must be controlled by the test mode software utility from the silicon supplier. The user interface is implemented through the supplied LANLook software package. LANLook runs on a standard PC and uses a conventional Windows®, based interface for both instrument configuration and results displays in clear numerical and graphical formats. LANLook communicates with the MT8860C through a GPIB interface.

Main Features:
Integrated 802.11a/b/g/n transmitter and receiver tester
• "Network" mode - Establish a connection with the DUT using standard WLAN protocol and then test the device
• Use the built-in DHCP server to automatically configure the IP settings of DUT
Packet loopback mode simplifies the measurement of DUT transmitters
Built in standard reference radio, capable of measuring the calibrated packet error ratio (PER)
Direct mode - Testing WLAN devices with the support of testing mode software provided by chipset manufacturers
• Transmission of user-defined WLAN packets
• Built in transmitter analyzer
• Shortened the design time of the testing system
High speed transmitter performance measurement, including power burst characteristics, spectrum templates, and CCDF Error Vector Magnitude (EVM) measurement, constellation display
• Use LANLook software for instrument configuration and display of measurement results

 

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